NAOC Open IR
光线追迹法在双折射滤光器误差分析中的应用
玄伟佳; 王东光; 邓元勇; 张志勇; 孙英姿
2008
Source Publication光学精密工程
ISSN1004-924X
Volume016Issue:005Pages:771
Abstract从单轴晶体的双折射性质出发,应用光线追迹方法,研究了滤光器系统中光的传播规律。将光线的传播方向、相位信息和振动状态用人射角、入射光方位角和晶体参量表示出来,结合偏振光的干涉原理,辅以计算机编程,分析了多种误差源对透过带形状的影响。通过与Evans离轴效应公式的对比,得到0.7%的最大相对误差,从而验证了本文方法的正确性,为滤光器的研制提供了可靠依据。
Language英语
Document Type期刊论文
Identifierhttp://ir.bao.ac.cn/handle/114a11/47530
Collection中国科学院国家天文台
Affiliation中国科学院国家天文台
First Author AffilicationNational Astronomical Observatories, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
玄伟佳,王东光,邓元勇,等. 光线追迹法在双折射滤光器误差分析中的应用[J]. 光学精密工程,2008,016(005):771.
APA 玄伟佳,王东光,邓元勇,张志勇,&孙英姿.(2008).光线追迹法在双折射滤光器误差分析中的应用.光学精密工程,016(005),771.
MLA 玄伟佳,et al."光线追迹法在双折射滤光器误差分析中的应用".光学精密工程 016.005(2008):771.
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