NAOC Open IR
kaf4301eccd在低温下微光成像特性的实验研究
李彬华1; 魏名智2; 叶彬浔1; 宋谦1
2006
Source Publication光学技术
ISSN1002-1582
Volume32Issue:1Pages:3
Abstract介绍了实验的原理和方法;重点介绍了在低温下KAF-4301E CCD的成像特性——量子效率(QE)、电荷转移效率(CTE)、读出噪声、暗电流和满阱等的测试结果。实验结果显示,随CCD工作温度降低并超过其最小标称值后,虽然暗流则明显减小,但CTE性能快速变差。从理论上对所得的结果进行了简短的分析和讨论。分析了该型号CCD在微光成像方面的应用前景。
Language英语
Document Type期刊论文
Identifierhttp://ir.bao.ac.cn/handle/114a11/45168
Collection中国科学院国家天文台
Affiliation1.中国科学院国家天文台
2.UCO/Lick Observatory University of California,Santa Cruz, CA
First Author AffilicationNational Astronomical Observatories, Chinese Academy of Sciences
Recommended Citation
GB/T 7714
李彬华,魏名智,叶彬浔,等. kaf4301eccd在低温下微光成像特性的实验研究[J]. 光学技术,2006,32(1):3.
APA 李彬华,魏名智,叶彬浔,&宋谦.(2006).kaf4301eccd在低温下微光成像特性的实验研究.光学技术,32(1),3.
MLA 李彬华,et al."kaf4301eccd在低温下微光成像特性的实验研究".光学技术 32.1(2006):3.
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